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EPM1270芯片破解技术分析

时间:2011-03-28 08:57:17

世纪芯专业提供各种IC芯片和单片机解密服务,涵盖典型的FPGA解密、MASK掩膜芯片解密、EPM1270解密等等,世纪芯始终坚持透明、公正、合理、沟通、清晰的报价原则,坚持合作共赢的原则,为客户提供最具竞争力的服务,同时通过详细的评估数据参考进行所有项目报价,使客户项目开发过程的每一笔支出都清晰可查。
All MAX  II devices provide Joint Test Action Group (JTAG) boundary-
scan test (BST) circuitry that complies with the IEEE Std. 1149.1-2001
specification. JTAG boundary-scan testing can only be performed at any
and all V  banks have been fully powered and a time after V CCINT CCIO
amount of time has passed. MAX II devices can also use the JTAG CONFIG
port for in-system programming together with either the Quartus software or hardware using Programming Object Files (.pof), Jam Standard Test and Programming Language (STAPL) Files (.jam) or Jam Byte-Code Files (.jbc).
The JTAG pins support 1.5-V, 1.8-V, 2.5-V, or 3.3-V I/O standards. The  of the supported voltage level and standard is determined by the V
bank where it resides. The dedicated JTAG pins reside in Bank 1 of all MAX II devices.
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