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EPM570芯片技术研究

时间:2011-04-08 09:31:03

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EPM570芯片介绍:
All MAX II devices provide Joint Test Action Group (JTAG) boundary-scan test (BST) circuitry that complies with the IEEE Std. 1149.1-2001
specification. JTAG boundary-scan testing can only be performed at any time after VCCINT and all VCCIO banks have been fully powered and a
tCONFIG amount of time has passed. MAX II devices can also use the JTAG port for in-system programming together with either the Quartus II
software or hardware using Programming Object Files (.pof), JamTM Standard Test and Programming Language (STAPL) Files (.jam) or Jam Byte-Code Files (.jbc).
The JTAG pins support 1.5-V, 1.8-V, 2.5-V, or 3.3-V I/O standards. The supported voltage level and standard is determined by the VCCIO of the
bank where it resides. The dedicated JTAG pins reside in Bank 1 of all MAX II devices.
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