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EPM7032AE芯片解密功能分析

时间:2011-04-01 09:08:45

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EPM7032AE芯片主要性能特点:
High-performance 3.3-V EEPROM-based programmable logic devices (PLDs) built on second-generation Multiple Array MatriX
(MAX 3.3-V in-system programmability (ISP) through the built-in IEEEStd.1149.1 Joint Test Action Group (JTAG) interface with advanced pin-locking capability
-MAX 7000AE device in-system programmability (ISP) circuitry compliant with IEEE Std. 1532
-EPM7128A and EPM7256A device ISP circuitry compatible with
IEEE Std. 1532 Built-in boundary-scan test (BST) circuitry compliant with IEEEStd.1149.1 Supports JEDEC Jam Standard Test and Programming Language (STAPL) JESD-71 Enhanced ISP features
-Enhanced ISP algorithm for faster programming (excluding EPM7128A and EPM7256A devices)
-ISP_Done bit to ensure complete programming (excluding EPM7128A and EPM7256A devices)
-Pull-up resistor on I/O pins during in-system programmin Pin-compatible with the popular 5.0-V MAX7000S devices High-density PLDs ranging from 600 to 10,000 usable gates Extended temperature range
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